Advances in X-Ray Analysis: Volume 35B by Gerald R. Lachance (auth.), Charles S. Barrett, John V.

By Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.)

Whole trend becoming, Rietveld research, and Calculated Diffraction styles. Quantitative part research by means of XRay Diffraction (XRD). skinny movie and floor Characterization by way of XRD. Lattice Defects and XRay Topography. Texture research by way of XRD. XRD Instrumentation, suggestions, and Reference fabrics. tension choice by means of Diffraction equipment. XRD Profile becoming, Crystallite measurement and pressure choice. XRD functions: Detection Limits, Superconductors, Organics, Minerals. Mathematical equipment in XRay Spectrometry (XRS). skinny movie and floor Characterization via XRS and XPS. overall mirrored image XRS. XRS thoughts and Instrumentation. XRS functions. XRay Imaging and Tomography. 161 articles. Index.

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Sherman, Spectrochim. Acta 7:283 (1955). 2. W. S. Birks, Anal. Chem. 40:1080 (1968). 3. F ver. 1. , USA (1990). 4. V. I. Smolniakov, paper presented for publ. in Journ. Plant Laboratory, Moscow. 5. R. Tertian, ~ Spectrom. 17:1989 (1988). 6. G. V. Kemp, Anal. Chem. 30:1306 (1958). 7. F. Losev, "Kolichestvenny rentgenospectralny fluorescentny analiz". Atomizdat, Moscow (1973). 8. I. A. Pshenichny. "Fluorescentny rentgeno-spectralny analiz", Nauka, Moscow (1973) 9. V. Bahtiarov, "Rentgenospectralny fluorescentny analiz v geologii i geohimii", Nedra.

265-288. , 1973, Atomic Data Tables, 5, 51-111. , M. Mickael, T. P. Gardner, "A New Analysis Principle for EDXRF: the Monte Carlo - Library Least-Squares Principle", Advances in X-Ray Analysis, Vol. 31, pp. 461-469. Yacout, A. P. Gardner, and K. Verghese, 1984, "Cubic Spline Techniques for Fitting X-Ray Cross Sections", Nuclear Instruments and Methods in Physics Research, 220, 461-472. Yacout, A. P. Gardner, and K. Verghese, 1986, "Cubic Spline Representation of the Two-Variable Cumulative Distribution Functions for Coherent and Incoherent X-Ray Scattering", X-Ray Spectrometry, 15, 259-265.

Schamber, Proc. 8th Nat. Conf. 2n Electron Probe Analysis 85 (1973). 2. , USA (1990). 3. H. , Ann. 241 (1977). 4. J. H. Schamber, Proc. Workshop 2n Energy Dispersive X-Ray Spectrometry, p. 273 Gaithersburg (1979). 5. C. Russ, Proc. 297 Gaithersburg (1979). 6. L. J. , 1974. 7. 0 by Dept. , University of Antwerp, Belgium (1990). X-RAY FLUORESCENCE ANALYSIS OF NONHOMOGENEOUS MATERIALS BY 6p-CORRECTION METHOD V. I. Karmanov and V. V. O. Paton Electric Welding Institute of the Ukraine Academy of Sciences, Kiev, Ukraine ABSTRACT The fundamental parameters method (FPM) enables one to determine with high accuracy the chemical composition of homogeneous samples, having only one reference sample.

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